Close

Organization

Delft University of Technology
Contributors
Rajendra Bishnoi
Sumit Diware
Said Hamdioui
Session Chairs
Mottaqiallah Taouil
Presentations
Research Special Session
Device-Aware Test: A Means to Attack Unmodeled Defects
2:30pm - 3:00pm PDT Tuesday, June 24 3010, Level 3
EDA
Research Manuscript
Enhancing Parallelism and Energy-Efficiency in SOT-MRAM based CIM Architecture for On-Chip Learning
4:15pm - 4:30pm PDT Monday, June 23 3001, Level 3
Design
DES5: Emerging Device and Interconnect Technologies
Sessions
Research Special Session
On the Limitations of VLSI Structural Manufacturing Test and Future Directions
1:30pm - 3:00pm PDT Tuesday, June 24 3010, Level 3
EDA