Presentation
Maximizing IR sign-off coverage using Sigma-AV and its benefit on PPA
DescriptionA new approach to IR drop analysis using Sigma-AV that addresses the shortcomings of traditional dynamic IR sign-off methods for mobile SoCs. Traditional methods suffer from limited coverage, high compute requirements, difficulties in outlier handling, and lower tech node complexities. These limitations can lead to over-designed power grids, impacting power, performance, and area (PPA).
Sigma-AV overcomes these by analyzing self-drop, aggressor drop, and regional drop to achieve comprehensive IR drop coverage. It reports self-drop and aggressor drop for every instance, ensuring high confidence in local switching noise coverage. The self-drop metric improves power grid issues, and the aggressor drop metric enhances the dynamic IR profile. Sigma-AV enables power grid optimization and cell profiling without requiring a complete PNR cycle. Design IR profiles can be enhanced via selective swaps using an ECO tool-based flow guided by Sigma-AV's aggressor list. Sigma-AV also identifies issues such as ICG/AON buffer clustering and multi-bit cell IR drops , which traditional methods often miss. Compared to vectorless Dynamic IR, Sigma-AV shows over 40% runtime improvement and 3-4x faster voltage impact view.
Sigma-AV enables faster, efficient IR analysis, improving PPA and reducing design cycle times.
Sigma-AV overcomes these by analyzing self-drop, aggressor drop, and regional drop to achieve comprehensive IR drop coverage. It reports self-drop and aggressor drop for every instance, ensuring high confidence in local switching noise coverage. The self-drop metric improves power grid issues, and the aggressor drop metric enhances the dynamic IR profile. Sigma-AV enables power grid optimization and cell profiling without requiring a complete PNR cycle. Design IR profiles can be enhanced via selective swaps using an ECO tool-based flow guided by Sigma-AV's aggressor list. Sigma-AV also identifies issues such as ICG/AON buffer clustering and multi-bit cell IR drops , which traditional methods often miss. Compared to vectorless Dynamic IR, Sigma-AV shows over 40% runtime improvement and 3-4x faster voltage impact view.
Sigma-AV enables faster, efficient IR analysis, improving PPA and reducing design cycle times.
Event Type
Engineering Poster
TimeTuesday, June 245:00pm - 6:00pm PDT
LocationEngineering Posters, Level 2 Exhibit Hall