Presentation
Innovative and Cost-Effective Approach to ESD Reliability Verification in the Cloud
DescriptionAs semiconductor designs grow increasingly complex, optimizing reliability verification processes, particularly for Electrostatic Discharge (ESD), is critical to managing costs and improving efficiency in cloud environments. Traditional approaches, reliant on increasing hardware resources, often result in marginal performance improvements while significantly escalating costs.
This presentation explores innovative strategies for optimizing ESD verification workflows, emphasizing advanced parallelization techniques, hardware optimization, and predictive resource allocation using machine learning. By adopting these methods, substantial improvements in runtime and cost efficiency were achieved. Key highlights include improved hardware utilization, faster simulations, and reduced resource wastage, all while maintaining scalability and flexibility.
The proposed methodologies effectively address challenges associated with inefficient resource allocation and escalating license costs, presenting a cost-effective and high-performance solution for ESD reliability verification in cloud environments. These advancements mark a significant step forward in aligning verification processes with the demands of modern semiconductor design.
This presentation explores innovative strategies for optimizing ESD verification workflows, emphasizing advanced parallelization techniques, hardware optimization, and predictive resource allocation using machine learning. By adopting these methods, substantial improvements in runtime and cost efficiency were achieved. Key highlights include improved hardware utilization, faster simulations, and reduced resource wastage, all while maintaining scalability and flexibility.
The proposed methodologies effectively address challenges associated with inefficient resource allocation and escalating license costs, presenting a cost-effective and high-performance solution for ESD reliability verification in cloud environments. These advancements mark a significant step forward in aligning verification processes with the demands of modern semiconductor design.
Event Type
Engineering Poster
Networking
TimeWednesday, June 2512:15pm - 1:15pm PDT
LocationEngineering Posters, Level 2 Exhibit Hall