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BEGIN:VEVENT
DTSTAMP:20260402T024533Z
LOCATION:3008\, Level 3
DTSTART;TZID=America/Los_Angeles:20250624T163000
DTEND;TZID=America/Los_Angeles:20250624T164500
UID:dac_DAC 2025_sess157_RESEARCH376@linklings.com
SUMMARY:DroidFuzz: Proprietary Driver Fuzzing for Embedded Android Devices
DESCRIPTION:Jianzhong Liu, Yuheng Shen, and Yifei Chu (Tsinghua University
 ); Qiang Zhang (Hunan University); Heyuan Shi (Central South University); 
 Wanli Chang (Hunan University); and Yu Jiang (Tsinghua University)\n\nEmbe
 dded Android Devices have proliferated in many security-critical embedded 
 scenarios, requiring sufficient testing to root out vulnerabilities. Due t
 o Android's architecture, which uses a Hardware Abstraction Layer (HAL) fo
 r vendor-specific driver implementations, traditional kernel testing techn
 iques cannot detect such bugs within the actual driver logic, which are co
 mmonly proprietary and vendor-specific. In this paper, we propose DroidFuz
 z, an embedded Android system fuzzer that targets such vendor-specific dri
 ver implementations to find such bugs. Through leveraging pre-testing HAL 
 driver probing, kernel-user relational payload generation, and cross-bound
 ary execution state feedback, we effectively test the proprietary drivers 
 in both the kernel and the HAL layer. We implemented DroidFuzz and evaluat
 ed its effectiveness on 7 embedded Android devices, and found 12 security-
 critical previously unknown bugs, all of which have been confirmed by the 
 respective vendors.\n\nTopics: Systems\n\nTracks: SYS3: Embedded Software\
 n\nSession Chairs: Hoeseok Yang (Santa Clara University) and Younghyun Kim
  (Purdue University)\n\n
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